Efficient Test Data Compression Using Transition Directed Run-length Code in System-on-a-chip

A new test data compression method using Transition Directed Run-length code (TDR) is proposed. The proposed method is suitable for encoding the test set for embedded cores in a system-on-a-chip. The previous researches have shown that run-length coding can provide high compression ratio for the test data. However, experimental data show that inefficient encoding is located the near of test different data. The proposed method overcomes the near of inefficient codeword. Experimental results show that the proposed approach works well for large ISCAS 89 benchmark circuits and obtains very high compression ratio.